IEC TR 62380 (formerly RDF 2000) RDF 2000 is a reliability data handbook, reference UTE C 80-810, that provides failure rates for electronic equipment. Other sources of failure rate data are RAC Prism, Telcordia SR-332 and the MIL-217 reliability prediction handbook. The RDF 2000 reliability prediction method considers the effects of phased mission profiles on operating and non-operating components.

• Reliability Data Analysis

IEC/TR 62380: Reliability Data Handbook – A Universal Model for Reliability Prediction of Electronics Components. RDF 2000 – Reliability Data Handbook.

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• Continue reading IEC TR 62380 Failure Rates. IEC TR 62380 (formerly RDF 2000) RDF 2000 is a reliability data handbook, reference UTE C 80-810.

The RDF 2000 reliability prediction method accounts for the effects of both ambient temperature variation and equipment switch on and switch off temperature variations on the component failure rate. RDF 2000 also predicts infant mortality and wear-out periods. Reliability data contained in the handbook originates mainly from field data operating in the following environments:. Ground, stationary, weather-protected. Ground, stationary, non-weather-protected.

Airborne, inhabited, cargo. Ground, non-stationary, moderate Isograph’s Reliability Workbench computer program allows you to build reliability prediction models based on this standard. Reliability Workbench also allows you to integrate prediction methods with failure mode and effect analysis, reliability block diagram analysis, maintainability prediction, fault tree analysis, event tree analysis and Markov analysis. For more information visit Isograph’s web site.

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Reliability Data Analysis

Reliability MTBF calculation. RDF 2000 predictive method. IEC 62380 Reliability Prediction and MTBF Enquiries: Tel: +44 (0)1782 479 230 RDF 2000 Predictive Method RDF 2000 is a reliability data handbook developed by the French telecommunications industry. This standard provides reliability prediction models for a range of electronic components using cycling profiles and applicable phases as a basis for failure rate calculations.

The RDF 2000 method provided a unique approach to handle mission profiles in the failure rate prediction. Component failure is defined in terms of an empirical expression containing a base failure rate that is multiplied by factors influenced by mission profiles. These mission profiles contain information about how the component failure rate may be affected by operational cycling, ambient temperature variation and/or equipment switch on/off temperature variations. RDF 2000 disregards the wearout period and the infant mortality stage of product life based on the assumption that, for most electronic components, the wearout period is never reached because new products will replace the old ones before the wearout occurs. Although the standard has been largly superceded by IEC 62380 it is still used occasionally to provide comparative MTBF figures for older equipment. If you would like a quotation for reliability MTBF calculations to RDF 2000 or any of the other reliability models, please contact us on the numbers below.

If you are uncertain of the requirements or procedures involved we would be pleased to review your product specification and advise accordingly. To contact us For all enquiries please e-mail or telephone +44 (0)1782 479 230 Allied Approvals Ltd is incorporated and registered in the United Kingdom.

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